Article citationsMore>>

Gaubas, E. and Vanhellemont, J. (1996) A Simple Technique for the Separation of Bulk and Surface Recombination Parameters in Silicon. Journal of Applied Physics, 80, 6293-6297.
https://doi.org/10.1063/1.363705

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top