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Kotipalli, R., Vermang, B., Joel, J., Rajkumar, R., Edoff, M. and Flandre, D. (2015) Investigating the Electronic Properties of Al2O3/Cu(In,Ga)Se2 Interface. AIP Advances, 5, Article ID: 107101.
https://doi.org/10.1063/1.4932512

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