Article citationsMore>>

Hosmer Jr., D.W., Lemeshow, S. and Sturdivant, R.X. (2013) Applied Logistic Regression. John Wiley & Sons, Hoboken, 398.
https://doi.org/10.1002/9781118548387

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top