TITLE:
ArcGISTM and Principal Component Analysis of Probe Data to Micro-Map Minerals in Round Top Rare Earth Deposit
AUTHORS:
Lorraine M. Negrón, Margaret Piranian, Maria A. Amaya, Daniel Gorski, Nicholas E. Pingitore
KEYWORDS:
ArcGISTM, Electron Probe Microanalysis, Principal Component Analy-sis, Rare Earths, Yttrofluorite, X-Ray Map Analyzer, Round Top
JOURNAL NAME:
Advances in Materials Physics and Chemistry,
Vol.10 No.2,
February
21,
2020
ABSTRACT: Rare earth elements (REEs), especially heavy rare earth elements (HREEs), are in demand for their current and emerging applications in advanced technologies. Here we perform computer-driven micro-mapping at the millimeter scale of the minerals that comprise Round Top Mountain, in west Texas, USA. This large rhyolite deposit is enriched in HREEs and such other critical elements as Li, Be, and U. Electron probe microanalysis of 2 × 2 mm areas of thin sections of the rhyolite produced individual maps of 16 elements. These were superimposed to generate a 16-element composition at each pixel. Principal components analysis of elements at each pixel identified the specific mineral at that site. The pixels were then relabeled as the appropriate minerals, thereby producing a single mineral map. The overall mineral composition of the 7 studied samples compared favorably with prior analyses of the Round Top deposit available in the literature. Likewise the range of porosity in the maps was consistent with that of previous direct measurements by water saturation. This new statistical and GIS-based technique provides a robust and unbiased approach to electron microprobe mapping. The study further showed that the high-value yttrofluorite grains exhibited little tendency to cluster with other late-stage trace minerals and that the samples extended the previously documented overall homogeneity of the deposit at field scale to this microscopic scale.