Article citationsMore>>

J. D. Albrecht, R. P. Wang, P. P. Ruden, M. Farahmand and K. F. Brennan, “Electron Transport Characteristics of GaN for High Temperature Device Modeling,” Journal of Applied Physics, Vol. 83, No. 9, 1998, pp. 4777- 4781. doi:10.1063/1.367269

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top