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Osaka ,T. Takano, N., Kurokawa, T., Kaneko, T. and Ueno, K. (2003) Characterization of chemically-depo- sited NiB and NiWB thin films as a capping layer for ULSI application. Surface and Coatings Technology, 169-170, 124-127. doi:10.1016/S0257-8972(03)00186-5

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