TITLE:
Effect of Ti4+ Doping on Structural, Electrical and Magnetic Properties of Ni0.4Cu0.2Zn0.4Fe2-xTixO4 Ferrites
AUTHORS:
Sajal Chandra Mazumdar, Farhad Alam, Umma Habiba Tanni, Kamrunnahar Kali, Bablu Chandra Das, Mohammed Nazrul Islam Khan
KEYWORDS:
Ferrite, X-Ray Diffraction, VSM, SEM, Dielectric Properties, Magnetization
JOURNAL NAME:
Materials Sciences and Applications,
Vol.10 No.12,
November
29,
2019
ABSTRACT: Ti4+ doped Ni0.4Cu0.2Zn0.4Fe2-xTixO4 (x = 0.0, 0.02, 0.05, 0.07, 0.10) chemical compositions are prepared by
conventional solid state reaction technique. The ferrite phase formation has
been confirmed from the pattern of XRD. The theoretical density (ρth), bulk density (ρB), and porosity are calculated
from the XRD data and using approximate formulas. Value of ρth is found to be greater than the value of ρB indicating the formation
of pores inside the bulk specimens. The micro-structural investigation has been
done using Field Emission Scanning Electron Microscope and it is found that the
average grain size reduces with the increase of Ti content. Saturation
magnetization (Ms) also
reduces with the increase of Ti content, contrarily remanent magnetization (Mr) and coercivity (Hc) increases with the
concentration of Ti in the composition due to the pinning effect. The real part
of the initial permeability is found to be maximum for the x = 0.02 sample which could be due to the homogeneity and high
density of the sample. For increasing frequency, the dielectric constant and
dielectric loss are observed to decrease.