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Zhang, J.D., Fung, S., Bin, L.L. and Jun, L.Z. (2002) Ti ion Valence Variation Induced by Ionizing Radiation at TiO2/Si Interface. Surface and Coatings Technology, 158-159, 238-241.
https://doi.org/10.1016/S0257-8972(02)00218-9

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