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Österle, W., Rooch, H., Pyzalla, A. and Wang, L. (2001) Investigation of White Etching Layers on Rails by Optical Microscopy, Electron Microscopy, X-Ray and Synchrotron X-Ray Diffraction. Materials Science and Engineering A, 303, 150-157.
https://doi.org/10.1016/S0921-5093(00)01842-6

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