Article citationsMore>>

Yang, B.L., Lai, P.T. and Wong, H. (2004) Current Conduction Mechanism in Thin Gate Dielectrics Microelectron. Reliability, 44, 709-718.
https://doi.org/10.1016/j.microrel.2004.01.013

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top