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V. Senthilkumar and P. Vickraman, “Structural, Optical and Electrical Studies on Nanocrystalline Tin Oxide (SnO2) Thin Films by Electron Beam Evaporation Technique,” Journal of Materials Science: Materials in Electronics, Vol. 21, No. 6, 2010, pp. 578-583. doi:10.1007/s10854-009-9960-x

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