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J. L. Genicot and J. P. Alzetta, “New Technique Using Room Temperature Diodes for the Direct Assessment of Internal Contamination by Low Energy Gamma-Ray Emitters,” Applied Radiation and Isotopes, Vol. 48, No. 3, 1997, pp. 349-358. doi:10.1016/S0969-8043(96)00222-9

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