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Meunier, V., Lohnert, U., Kollias, P. and Crewell, S. (2013) Biases Caused by the Instrument Bandwidth and Beam Width on Simulated Brightness Temperature Measurements from Scanning Microwave Radiometers. Atmospheric Measurement Techniques, 6, 1171-1187. https://doi.org/10.5194/amt-6-1171-2013

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