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Takada, K., Yokohama, I., Chida, K. and Noda, J. (1987) New Measurement System for Fault Location in Optical Waveguide Devices Based on an Interferometric Technique. Applied Optics, 26, 1603-1606.
https://www.ncbi.nlm.nih.gov/pubmed/20454375
https://doi.org/10.1364/AO.26.001603

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