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A. Van Veen, H. Schut, M. Clement, J. M. M. de Nijs, A. Kruseman and M. R. IJpma, “VEPFIT Applied to Depth Profiling Problems,” Applied Surface Science, Vol. 85, No. 2, 1995, pp. 216-224. doi:10.1016/0169-4332(94)00334-3

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