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J. J. McClelland, W. R. Anderson, C. C. Bradley, et al., “Accuracy of Nanoscale Pitch Standards Fabricated by Laser-Focused Atomic Deposition,” Journal of Research of the National Institute of Standards and Technology, Vol. 108, No. 2, 2003, pp. 99-113.

has been cited by the following article:

• TITLE: Analysis of Cr Atoms Three-Dimensional Deposition Characteristics

  AUTHORS: Hua-Lei Yang, Wen-Tao Zhang, Jian Yang

  KEYWORDS: Three-Dimensional Analysis, Atom Deposition, Cr Atoms, Gaussian Laser Standing Wave Field

  JOURNAL NAME: World Journal of Nano Science and Engineering, Vol.1 No.3, September 29, 2011

  ABSTRACT: The semi-classical model is used to simulate the three-dimensional trajectory and deposition distribution of the chromium atoms in the Gaussian laser standing wave field using the Runge-Kutta method, and then the three-dimensional deposition stripes are also given, besides, the effects of atomic beam divergence, chromatic aberration and spherical aberration on deposition structure are also analyzed.