TITLE:
A Comparative Study of Bisphenol-A, Hydantoin and Cyanuric Acid Based Epoxy Resins Using XRD
AUTHORS:
Sanjay Swarup
KEYWORDS:
X-Ray Diffraction, Epoxy Resins, Fourier Analysis, Crystallinity
JOURNAL NAME:
Materials Sciences and Applications,
Vol.2 No.10,
October
18,
2011
ABSTRACT: To evaluate the efficiency of modified epoxy resins using bisphenol-A, hydantoin & cyanuric acid & to investigate the structural change due to the presence of Nitrogen atoms in polymeric chain for improved insulating properties, weatherability etc. The samples of epoxy resin bisphenol-a, hydantoin and Cyanuric acid based was taken for X-RAY diffraction analysis. The diffraction patterns were Fourier analysed to get an exact idea about the change in the polymer structure. From X-RAY diffraction analysis it was found that all physical parameters like area of cross section, number of carbon atoms per entanglement, stiffness parameter, particle size, percentage crystallinity & electron density fluctuation, in case of bisphenol-A based epoxy resin is more than other epoxy resins; that is; as the number of nitrogen atoms increased, all the physical parameters were reducedIn the present study only X-ray diffraction patterns of bisphenol-A, hydantoin and cyanuric acid based epoxy resins were studied. However their dielectric and ultrasonic properties could also be studied to get more information about the structur With the help of X-RAY diffraction patterns, one can easily check the synthesized samples of epoxy resins. The method to investigate the structural analysis of epoxy resin was novel and could find numerous applications in surfacecoatings.