Article citationsMore>>

Baker-Jarvis, J., Janezic, M.D. and Degroot, D.C. (2010) High Frequency Dielectric Measurements. IEEE Instrumentation & Measurement Magazine, 13, 24-31.
https://doi.org/10.1109/MIM.2010.5438334

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top