Article citationsMore>>

Hosmer. D.W. and Lemeshow, S. (2000) Applied Logistic Regression. 2nd Edition, John Wiley and Sons, New York, Chapter 5, 160-164.
https://doi.org/10.1002/0471722146

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top