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Velterop, L., Delhez, R., de Keijser, Th.H., Mittemeijer, E.J. and Reefman, D. (2000) X-Ray Diffraction Analysis of Stacking and Twin Faults in f.c.c. Metals: A Revision and Allowance for Texture and Non-Uniform Fault Probabilities. Journal of Applied Crystallography, 33, 296.
https://doi.org/10.1107/S0021889800000133

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