Article citationsMore>>

Sakurai, J., Harako, S., Ohtsuki, T., Komuro, S., Hirao, N., Kasahara, R. and Zhao, X. (2012) Photoluminescence and X-Ray Absorption Fine Structure Analysis of Sm-Doped TiO2 Thin Films. Japanese Journal of Applied Physics, 51, 06FG03.
https://doi.org/10.1143/JJAP.51.06FG03

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top