Article citationsMore>>

Gust, W., et al. (1982) Measurement of the Grain Boundary Diffusion of In in Ni Bicrystals by the SIMS Technique. Acta Metallurgica, 30, 75-82.
https://doi.org/10.1016/0001-6160(82)90046-3

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top