Article citationsMore>>

Paulson, P.D., Birkmire, R.W. and Shafarman, W.N. (2003) Optical Characterization of CuIn1-xGaxSe2 Alloy Thin Films by Spectroscopic Ellipsometry. Journal of Applied Physics, 94, 879-888.
https://doi.org/10.1063/1.1581345

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top