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Wen, P.-Y., Li, D.-Y., Znang, S.-M., Liu, J.-P., Zhang, L.-Q., Zhou, K., Feng, M.-X., Tian, A.-Q., Ahang, F., Zeng, C. and Yang, H. (2015) Identification of Degradation Mechanisms Based on Thermal Characteristic of InGaN/GaN Laser Diode. IEEE Journal of Selected Topics in Quantum Electronics, 21, 6.

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