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Goerigk, G. and Williamson, D.L. (2006) Temperature Induced Differences in the Nanostructure of Hot-Wire Deposited Silicon-Germanium Alloys Analyzed by Anomalous Small-Angle X-Ray Scattering. Journal of Applied Physics, 99, 1-13.
https://doi.org/10.1063/1.2187088

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