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M. Seck, A. P. Roelfs and P. S. Teng, “Effect of Leaf Rust Puccinia recondite triticii on Yield of Four Isogenic Wheat Lines,” Crop Production, Vol. 7, No. 1, 1988, pp. 39-43. doi:10.1016/0261-2194(88)90036-1

has been cited by the following article:

• TITLE: Identification of Molecular Markers Linked to Leaf Rust Resistance Genes in Wheat and Their Detection in the Local Near-Isogenic Line

  AUTHORS: Navjot Kaur Dhillon, Harcharan Singh Dhaliwal

  KEYWORDS: RAPD, Lr9, Isogenic Lines

  JOURNAL NAME: American Journal of Plant Sciences, Vol.2 No.3, September 30, 2011

  ABSTRACT: Sixty-five random amplified polymorphic DNA (RAPD) primers were used for the detection of polymorphism among recipient and donor parents and their isogenic lines linked to leaf rust resistance genes, Lr9 and the resistant gene in kharchia local mutant KLM4-3B. Three primers showed polymorphism among recurrent parent, donor parent and isogenic lines.