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Zhao, W.-B., Zhang, G.-J., Yang, Y. and Zhang Yan, Zh. (2007) Correlation between Trapping Parameters and Surface Insulation Strength of Solid Dielectric under Pulse Voltage in Vacuum. IEEE Transactions on Dielectrics and Electrical Insulation, 14, 170-178.
https://doi.org/10.1109/TDEI.2007.302885

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