Article citationsMore>>

Stathis, J.H. (2002) Reliability Limits for the Gate Insulator in CMOS technology. IBM Journal of Research and Development, 46, 265-286.
https://doi.org/10.1147/rd.462.0265

has been cited by the following article:

• TITLE: Physical Limits of Computation

  AUTHORS: Tibor Guba, László Nánai, Thomas F. George

  KEYWORDS: Computation, Power Product, Entropy, SNL Limit

  JOURNAL NAME: Journal of Quantum Information Science, Vol.7 No.4, December 14, 2017

  ABSTRACT: The paper deals with theoretical treatment of physical limits for computation. We are using some statements on base of min energy/bit, power delay product, Shannon entropy and Heisenberg uncertainty principle which result in about kTln(2) energy for a bit of information.