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Lownes, N.E. and Machemehl, R.B. (2006) VISSIM, a Multi-Parameter Sensitivity Analysis. In: Perrone, L.F., Wieland, F.P., Liu, J., Lawson B.G., Nicol, D.M. and Fujimoto, R.M., Eds., Proceedings of the 2006 Winter Simulation Conference IEEE Xplore, Monterrey, 3-6 December 2006, 1406-1413.
https://doi.org/10.1109/WSC.2006.323241

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