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Van Gessel, A.F.H., van Grootel, S.C. and Bruggeman, P.J. (2013) Atomic Oxygen TALIF Measurements in an Atmospheric-Pressure Microwave Plasma Jet with in situ Xenon Calibration. Plasma Sources Science and Technology, 22, Article ID: 055010.
https://doi.org/10.1088/0963-0252/22/5/055010

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