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Herberholz, R., Rau, U., Schock, H.W., Haalboom, T., Gödecke, T., Ernst, F., Beilharz, C., Benz, K.W. and Cahen, D. (1999) Phase Segregation, Cu Migration and Junction Formation in Cu(In, Ga)Se2. The European Physical Journal Applied Physics, 6, 131.
https://doi.org/10.1051/epjap:1999162

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