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Meng, B., Booske, J. and Cooper, R. (1995) Extended Cavity Perturbation Technique to Determine the Complex Permittivity of Dielectric Materials. IEEE Trans. Microw. Theory Tech., 43, 2633-2636. https://doi.org/10.1109/22.473190

has been cited by the following article:

• TITLE: Permittivity Measurement of Low-Loss Substrates Based on Split Ring Resonators

  AUTHORS: Jianyi Li

  KEYWORDS: Split-Ring Resonators (SRR), Permittivity, Non-Contact Measurement

  JOURNAL NAME: World Journal of Engineering and Technology, Vol.5 No.4B, October 12, 2017

  ABSTRACT: In this paper, we present the complex permittivity measurement of low-loss substrates based on a microstrip-line-excited split-ring resonator (SRR). Permittivity of an unknown substrate is calculated based on the change in oscillation frequency of SRR caused by the material-under-test (MUT) above the SRR. Theoretical analysis and results of the simulations and experiments demonstrate the microstrip-line-excited SRR can be used to effectively improve measurement sensitivity. Simple equations for measurement of low-loss substrates using SRR are proposed and experimentally verified.