Article citationsMore>>

Hosmer, D. W., & Lemeshow, S. (2000). Applied Logistic Regression (2nd ed.). New York, NY: A Wiley-Interscience Publication.
https://doi.org/10.1002/0471722146

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top