Article citationsMore>>

Wilkinson, A.J., Meaden, G. and Dingley, D.J. (2006) High-Resolution Elastic Strain Measurement from Electron Backscatter Diffraction Patterns: New Levels of Sensitivity. Ultramicroscopy, 106, 307-313.

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top