Article citationsMore>>

J. I. Cisneros, “Optical Characterization of Dielectric and Semiconductor Thin Films by Use of Transmission Data,” Applied Optics, Vol. 37, August 1998, pp. 5262- 5270.

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top