Article citationsMore>>

F. Dulot, B. Kierren and D. Malterre, “Determination of Kinetic Parameters in Layer-By-Layer Growth from RHEED Profile Analysis,” Thin Solid Films, Vol. 423, No. 1, 2003, pp. 64-69. doi:10.1016/S0040-6090(02)00990-2

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top