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Y. Zheng, B. Wang and C. H. Woo, “Critical Thickness for Dislocation Generation during Ferroelectric Transition Thin Film on A Compliant Substrate ,” Applied Physics Letters, Vol. 89, No. 8, 2006, pp. 115-117. doi:10.1063/1.2338515

has been cited by the following article:

• TITLE: Properties of Phase Transformation of Ferroelectric Thin Films with Surface Layers

  AUTHORS: Lian Cui, Xu Xu, JiXin Che, Zelong He, Huijie Xue, Tianquan Lv

  KEYWORDS: Ferroelectric Thin Film, Surface Layer, Phase Transformation

  JOURNAL NAME: Journal of Modern Physics, Vol.2 No.9, September 19, 2011

  ABSTRACT: Using the generalized Ginzburg-Landau-Devonshire theory, the characteristics of phase transformation of a ferroelectric thin film with surface layers are investigated. We study the effect of the surface layer on the properties (coercive field, critical thickness) of a ferroelectric thin film. Our theoretical results show that the surface layer is likely to answer for the emergence of phase transformation.