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T. Fuyuki and H. Matsunami, “Electronic Properties of the Interface between Si and Tio2 Deposited at Very Low Temperatures,” Japanese Journal of Applied Physics, Vol. 25, No. 9, 1986, pp.1288-1291. doi:10.1143/JJAP.25.1288

has been cited by the following article:

• TITLE: Small Angle Neutron Scattering and X-Ray Diffraction Studies of Nanocrystalline Titanium Dioxide

  AUTHORS: M. Nasir Khan, J. Bashir

  KEYWORDS: Titanium Dioxide, Average Size, SANS, Microstructure, X-Ray Diffraction

  JOURNAL NAME: Journal of Modern Physics, Vol.2 No.9, September 19, 2011

  ABSTRACT: Nanocrystalline titanium dioxide powder is characterized for phase analysis as well as particle size and its distribution by x-ray diffraction and small angle neutron scattering measurements. Analysis of the SANS data in the momentum transfer range q = 0.1 - 1.8 nm–1 reveals an average particle size of 24.82 nm in good agreement with the particle size determined earlier by transmission electron microscopy. XRD measurement proves co-existence of rutile and anatase phases in this commercial TiO2 nanocrystalline powder.