Article citationsMore>>

Kim, C.M. and Bai, D.S. (2002) Analysis of Accelerated Life Test Data under Two Failure Modes. International Journal of Reliability, Quality and Safety Engineering, 9, 111-125.
https://doi.org/10.1142/S0218539302000706

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top