Article citationsMore>>

M.-H. Du, “First-Principles Study of Native Defects in TlBr: Carrier Trapping, Compensation, and Polarization Phenome-non,” Journal of Applied Physics, Vol. 108, No. 5, 2010, pp. 053506- 053510.

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top