Article citationsMore>>

Giese, A., Stolwijk, N.A. and Bracht, H. (2000) Double-Hump Diffusion Profiles of Copper and Nickel in Germanium Wafers Yielding Vacancy-Related Information. Applied Physics Letters, 77, 642-644.
https://doi.org/10.1063/1.127071

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top