Article citationsMore>>

Ozgu, M.R., Chen, J.C. and Eberhardt, N. (1973) A Capacitance Method for Measurement of Film Thickness in Two-Phase Flow. Review of Scientific Instruments, 44, 1714-1716.
https://doi.org/10.1063/1.1686039

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top