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Do, A.T., Nguyen, T.Q., Yeo, K.S. and Kim, T.T. (2013) Sensing Margin Enhancement Techniques for Ultra-Low-Voltage SRAMs Utilizing a Bitline-Boosting Current and Equalized Bitline Leakage. IEEE Transactions on Circuits and Systems II: Express Briefs, 59, 868-872.
https://doi.org/10.1109/TCSII.2012.2231014

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