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Devices, M., Yang, H., Member, S., Hwang, W. and Chuang, C. (2011) Impacts of NBTI/PBTI and Contact Resistance on Power-Gated SRAM with High-. IEEE Transactions on Very Large Scale Integration Systems, 19, 1192-1204.
https://doi.org/10.1109/TVLSI.2010.2049038

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