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Keshavarzi, A., Ma, S., Narendra, S., Bloechel, B., Mistry, K., Ghani, T. and De, V. (2001) Effectiveness of Reverse Body Bias for Leakage Control in Scaled Dual Vt CMOS ICs. Proceedings of the International Symposium on Low Power Electronics and Design, California, 6-7 August 2001, 207-212.
https://doi.org/10.1145/383082.383135

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