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Roy, K., Mukhopadhyay, S. and Mahmoodi-Meimand, H. (2003) Leakage Current Mechanisms and Leakage Reduction Techniques in Deep-Submicrometer CMOS Circuits. Proceedings of the IEEE, 91, 305-327.
https://doi.org/10.1109/JPROC.2002.808156

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