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Henson, W.K., Yang, N., Kubicek, S., Vogel, E.M., Wortman, J.J., Member, S., et al. (2000) Analysis of Leakage Currents and Impact on Off-State Power Consumption for CMOS Technology in the 100-nm Regime. IEEE Transactions on Electron Devices, 47, 1393-1400.
https://doi.org/10.1109/16.848282

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