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Rao, R., Srivastava, A., Blaauw, D. and Sylvester, D. (2004) Statistical Analysis of Subthreshold Leakage Current for VLSI Circuits. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 12, 131-139.
https://doi.org/10.1109/TVLSI.2003.821549

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