Article citationsMore>>

Perkins, R.H., Riley, T.J. and Gyurcsik, R.S. (1995) Thermal Uniformity and Stress Minimization during Rapid Thermal Processes. IEEE Transactions on Semiconductor Manufacturing, 8, 272-279.
https://doi.org/10.1109/66.401001

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top