Article citationsMore>>

Saritas, M. and Mckell, H.D. (1988) Comparison of Minority-Carrier Diffusion Length Measurement in Silicon by the Photoconductive Decay and Surface Photo Voltage Methods. Journal of Applied Physics, 63, 4561-4567.

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top